The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 02, 2016

Filed:

Jun. 26, 2014
Applicant:

Amazon Technologies, Inc., Reno, NV (US);

Inventors:

Prashanth Basavaraj Patil, Santa Clara, CA (US);

Scott Michael Dylewski, San Francisco, CA (US);

Yan Karasik, Sunnyvale, CA (US);

Assignee:

Amazon Technologies, Inc., Reno, NV (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 1/00 (2006.01); G01M 11/00 (2006.01); G01N 21/95 (2006.01); G01J 1/42 (2006.01); G01M 3/38 (2006.01);
U.S. Cl.
CPC ...
G01M 11/00 (2013.01); G01J 1/42 (2013.01); G01M 3/38 (2013.01); G01N 21/95 (2013.01); G01N 2201/125 (2013.01);
Abstract

According to one or more embodiments of the disclosure, a testing apparatus is provided. The testing apparatus may include a base portion configured to receive a device under test (DUT). The base portion may also include an array of light sensors to measure light leakage from the DUT. For example, the testing apparatus may receive, from the array of light sensors, one or more light intensity measurements associated with light leakage from between a bezel element and a display element along a first edge portion of the DUT. The testing apparatus may then transmit the measurements to a testing computer.


Find Patent Forward Citations

Loading…