The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 02, 2016
Filed:
Mar. 14, 2014
Seiko Epson Corporation, Tokyo, JP;
Atsushi Nagahara, Azumino, JP;
Seiko Epson Corporation, Tokyo, JP;
Abstract
A label production apparatus includes: a printing unit configured to print a label image on a first base material included in a print target medium that has the first base material, a second base material, and an adhesive layer interposed between the first base material and the second base material while using image data for generation of the label image; a test unit configured to test the label image printed on the print target medium; a memory unit configured to store layout information that specifies image arrangement positions when a plurality of label images are arranged on the print target medium; and a post-process unit that is configured to cut a portion of the first base material where the label image has been formed, and generates such a cut-line based on the layout information, if a print defect is detected by the test unit, that avoids cutting of the label image in which the print defect is detected among the plurality of label images so as to cut the first base material using the generated cut-line.