The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 02, 2016

Filed:

Jun. 27, 2012
Applicants:

Tyler W Garaas, Boston, MA (US);

Matthew Brand, Newton, MA (US);

Cibulka Josef, Praha, CS;

Inventors:

Tyler W Garaas, Boston, MA (US);

Matthew Brand, Newton, MA (US);

Cibulka Josef, Praha, CS;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B23K 26/38 (2014.01); G05B 15/02 (2006.01); G05B 19/4061 (2006.01);
U.S. Cl.
CPC ...
B23K 26/38 (2013.01); G05B 15/02 (2013.01); G05B 19/4061 (2013.01); G05B 2219/36199 (2013.01); G05B 2219/49157 (2013.01);
Abstract

Locations in a pattern of a part are evaluated to determine if the locations are interior or exterior to a feature of the pattern. The pattern is used to cut the feature from a material by a laser cutting machine. A location in the feature is rendered into an array stored in a memory so that a value stored at an address in the array corresponding to coordinates of the location is either odd or even as determined by a counting process of the rendering. Then, the location is identified as being interior if the value is odd, and as being exterior if the value is even. The rendering can use modified forms of either rasterization or ray casting.


Find Patent Forward Citations

Loading…