The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 02, 2016

Filed:

Jan. 16, 2013
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Yoshihiko Iwase, Kyoto, JP;

Tomoyuki Makihira, Tokyo, JP;

Makoto Sato, Tokyo, JP;

Kazuhide Miyata, Yokohama, JP;

Ritsuya Tomita, Kawasaki, JP;

Hiroyuki Shinbata, Tama, JP;

Daisuke Kibe, Chigasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/14 (2006.01); A61B 3/00 (2006.01); A61B 3/10 (2006.01); G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
A61B 3/102 (2013.01); G01B 9/02091 (2013.01);
Abstract

An imaging apparatus includes a planar image acquisition unit configured to acquire a planar image of a subject, a tomographic image acquisition unit configured to acquire a tomographic image of the subject, and a polarization adjustment member disposed in a common optical path of a portion of an optical system in the planar image acquisition unit and a portion of an optical system in the tomographic image acquisition unit and configured to adjust polarization states of a measuring beam for the planar image and a measuring beam for the tomographic image.


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