The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 26, 2016

Filed:

Jul. 15, 2013
Applicant:

California Institute of Technology, Pasadena, CA (US);

Inventors:

Morteza Gharib, Altadena, CA (US);

Jian Lu, Laguna Hills, CA (US);

Scott Hsieh, Anaheim, CA (US);

Francisco Pereira, Rome, IT;

Alexei Harvard, Pasadena, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/16 (2006.01); H04N 13/02 (2006.01); G01B 11/00 (2006.01); G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
H04N 13/0221 (2013.01); G01B 11/002 (2013.01); G06T 7/0069 (2013.01); H04N 13/0235 (2013.01); H04N 13/0253 (2013.01);
Abstract

A method and device for high-resolution three-dimensional (3-D) imaging which obtains camera pose using defocusing is disclosed. The device comprises a lens obstructed by a mask having two sets of apertures. The first set of apertures produces a plurality of defocused images of the object, which are used to obtain camera pose. The second set of optical filters produces a plurality of defocused images of a projected pattern of markers on the object. The images produced by the second set of apertures are differentiable from the images used to determine pose, and are used to construct a detailed 3-D image of the object. Using the known change in camera pose between captured images, the 3-D images produced can be overlaid to produce a high-resolution 3-D image of the object.


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