The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 2016
Filed:
Mar. 23, 2011
Hiroshi Aono, Miyoshi, JP;
Hiroshi Aono, Miyoshi, JP;
TOYOTA JIDOSHA KABUSHIKI KAISHA, Toyota-Shi, JP;
Abstract
A defect detecting apparatus detects a defect that is present on the outer circumferential surface of work having the outer circumferential surface thereof formed as a bent surface. The defect detecting apparatus is provided with: a jig which supports the work, and holds the work in a state wherein the work is rotated by a predetermined angle; an image pickup device, which picks up an image of the outer circumferential surface of the work held by the jig, the work being in the state wherein the work is rotated by the predetermined angle; and a controller, which processes an image obtained by means of the image pickup device, and determines a defect. The controller stores information relating to the shape of the outer circumferential surface of the work, and information relating to the positional relationship, at each rotation angle, between the image pickup device and a work area having the image thereof picked up by the image pickup device, and the control apparatus uses the information at the time of determining the defect.