The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 26, 2016

Filed:

Sep. 17, 2010
Applicants:

Junichi Shida, Kanagawa, JP;

Suk-hwan Chung, Kanagawa, JP;

Masashi Machida, Kanagawa, JP;

Inventors:

Junichi Shida, Kanagawa, JP;

Suk-Hwan Chung, Kanagawa, JP;

Masashi Machida, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B23K 26/06 (2014.01); B23K 26/064 (2014.01); B23K 26/067 (2006.01); H01L 21/268 (2006.01); H01L 21/02 (2006.01); B23K 26/08 (2014.01); B23K 26/12 (2014.01);
U.S. Cl.
CPC ...
H01L 21/268 (2013.01); B23K 26/063 (2013.01); B23K 26/0853 (2013.01); B23K 26/12 (2013.01); B23K 26/127 (2013.01); H01L 21/02532 (2013.01); H01L 21/02686 (2013.01);
Abstract

Provided is a laser annealing treatment including a laser light source that outputs pulse laser light, an optical system that shapes the pulse laser light, and leads the shaped pulse laser light to a semiconductor film subject to treatment, and a stage that carries the semiconductor film to be irradiated by the pulse laser light, wherein the pulse laser light irradiating the semiconductor film presents a rising time equal to or less than 35 nanoseconds from 10% of the maximum height to the maximum height in the pulse energy density, and a falling time equal to or more than 80 nanoseconds from the maximum height to 10% of the maximum height, thereby increasing, while an energy density suitable for crystallization and the like is not particularly increased, a margin quantity thereof, and carrying out high quality annealing treatment without decreasing a throughput.


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