The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 2016
Filed:
Oct. 18, 2012
Applicant:
Lsi Corporation, Milpitas, CA (US);
Inventors:
Wu Chang, Sunnyvale, CA (US);
Fan Zhang, Milpitas, CA (US);
Weijun Tan, Longmont, CO (US);
Shaohua Yang, San Jose, CA (US);
Assignee:
Avago Technologies General IP (Singapore) Pte. Ltd., Singapore, SG;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03M 13/00 (2006.01); G11B 27/36 (2006.01); G11B 20/18 (2006.01);
U.S. Cl.
CPC ...
G11B 27/36 (2013.01); G11B 20/1833 (2013.01);
Abstract
Various systems and methods for media defect detection.
Chang, Wu. (2016). Systems and methods for short media defect detection using multi-iteration soft data feedback (U.S. Patent No. 9245586). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9245586
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile