The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 26, 2016

Filed:

Dec. 13, 2011
Applicants:

Yogish Mallya, Bangalore, IN;

Timothy Poston, Bangalore, IN;

Inventors:

Yogish Mallya, Bangalore, IN;

Timothy Poston, Bangalore, IN;

Assignee:

KONINKLIJKE PHILIPS N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2006.01); G06T 19/00 (2011.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); G06T 7/0024 (2013.01); G06T 2207/10072 (2013.01);
Abstract

A method includes obtaining first volumetric image data, which is acquired at a first time, including a region of interest with a structural feature located at a first position. The method further includes obtaining second volumetric image data, which is acquired at a second different time, including the region of interest with the structural feature located at a second different position. The method further includes determining a registration transformation that registers the first and second volumetric image data such that the at least one structural feature in the first volumetric image data aligns with the at least one structural feature in the second volumetric image data. The registration transformation is based at least on a contour guided deformation registration. The method further includes generating a signal indicative of the registration transformation.


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