The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 26, 2016

Filed:

May. 20, 2014
Applicant:

Raytheon Company, Waltham, MA (US);

Inventors:

Christopher J. Beardsley, McKinney, TX (US);

Luan B. Do, McKinney, TX (US);

Assignee:

RAYTHEON COMPANY, Wahtlam, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/40 (2006.01); G06T 5/00 (2006.01); G06T 5/40 (2006.01);
U.S. Cl.
CPC ...
G06T 5/009 (2013.01); G06K 9/40 (2013.01); G06T 5/40 (2013.01); G06T 2207/10048 (2013.01); G06T 2207/20016 (2013.01); G06T 2207/20204 (2013.01);
Abstract

A system and method for image contrast enhancement using sub-segments. A coarse piecewise linear transform is formed based on the intensity distribution in an image, the segments of the piecewise linear transform selected to produce, when the piecewise linear transform is applied to the image, an improved intensity distribution, e.g., one approximating a Rayleigh distribution. A fine piecewise linear transform is formed by forming sub-segments at each of the breakpoints of the coarse piecewise linear transform.


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