The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 2016
Filed:
Oct. 10, 2013
Nec Laboratories America, Inc., Princeton, NJ (US);
Haifeng Chen, Old Bridge, NJ (US);
Min Ding, Chalfont, PA (US);
Bin Liu, Piscataway, NJ (US);
Abhishek Sharma, New Brunswick, NJ (US);
Kenji Yoshihira, Princeton Junction, NJ (US);
Guofei Jiang, Princeton, NJ (US);
NEC Laboratories America, Inc., Princeton, NJ (US);
Abstract
A system and method for analysis of complex systems which includes determining model parameters based on time series data, further including profiling a plurality of types of data properties to discover complex data properties and dependencies; classifying the data dependencies into predetermined categories for analysis; and generating a plurality of models based on the discovered properties and dependencies. The system and method may analyze, using a processor, the generated models based on a fitness score determined for each model to generate a status report for each model; integrate the status reports for each model to determine an anomaly score for the generated models; and generate an alarm when the anomaly score exceeds a predefined threshold.