The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 26, 2016

Filed:

Jul. 22, 2013
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Yaara Goldschmidt, Kiryat Ono, IL;

Ofer Lavi, Tel Aviv, IL;

Matan Ninio, Tel Aviv, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/18 (2006.01); G06N 99/00 (2010.01); G06N 7/00 (2006.01);
U.S. Cl.
CPC ...
G06N 99/005 (2013.01); G06N 7/005 (2013.01);
Abstract

A method, apparatus and product for automatic detection of anomalies in graphs. The method comprising obtaining training data, the training data comprising a plurality of graphs, each defined by nodes and edges connecting between the nodes, at least some of the nodes are labeled; determining a statistical model of a graph in accordance with the training data, the statistical model takes into account at least one structured and labeled feature of the graph, wherein the structured and labeled feature of the graph is defined based on a connection between a plurality of nodes and based on at least a portion of the labels of the plurality of nodes; obtaining an examined graph; and determining a score of the examined graph indicative of a similarity between the examined graph and the training data, wherein the score is based on a value of the structured and labeled feature in the examined graph.


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