The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 2016
Filed:
Jun. 14, 2013
Applicant:
Luminex Corporation, Austin, TX (US);
Inventors:
Matthew S. Fisher, Austin, TX (US);
Nicolas Arab, Austin, TX (US);
Assignee:
Luminex Corporation, Austin, TX (US);
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G01N 15/10 (2006.01); G01N 15/14 (2006.01);
U.S. Cl.
CPC ...
G06K 9/0014 (2013.01); G01N 15/1012 (2013.01); G01N 15/1456 (2013.01); G01N 15/1463 (2013.01); G01N 2015/1006 (2013.01);
Abstract
An apparatus and method for image normalization using a Gaussian residual of fit selection criteria. The method may include acquiring a two-dimensional image of a plurality of particles, where the plurality of particles comprises a plurality of calibration particles, and identifying a calibration particle by correlating a portion of the image corresponding to the calibration particle to a mathematical model (e.g. Gaussian fit). The measured intensity of the calibration particle may then be used to normalize the intensity of the image.