The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 26, 2016

Filed:

Apr. 30, 2014
Applicants:

Ertugrul Demircan, Austin, TX (US);

Mehul D. Shroff, Austin, TX (US);

Inventors:

Ertugrul Demircan, Austin, TX (US);

Mehul D. Shroff, Austin, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
G06F 17/5081 (2013.01); G06F 17/5036 (2013.01); G06F 17/5068 (2013.01); G06F 17/5077 (2013.01); G06F 2217/82 (2013.01);
Abstract

A technique for electromigration stress mitigation in interconnects of an integrated circuit design includes generating a maximal spanning tree of a directed graph, which represents an interconnect network of an integrated circuit design. A first point on the spanning tree having a lowest stress and a second point on the spanning tree having a highest stress are located. A maximum first stress between the first and second points is determined. In response to determining the maximum first stress between the first and second points is greater than a critical stress, a stub is added to the spanning tree at a node between the first and second points. The maximum first stress between the first and second points is re-determined subsequent to adding the stub.


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