The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 26, 2016

Filed:

Apr. 26, 2010
Applicants:

Vadim Berestetsky, Ontario, CA;

Allen V. Chan, Ontario, CA;

Suman K. Kalia, Ontario, CA;

Peter A. Lambros, Southampton, GB;

Stephen Rea, Winchester, GB;

Inventors:

Vadim Berestetsky, Ontario, CA;

Allen V. Chan, Ontario, CA;

Suman K. Kalia, Ontario, CA;

Peter A. Lambros, Southampton, GB;

Stephen Rea, Winchester, GB;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06F 9/44 (2006.01); G06F 15/16 (2006.01);
U.S. Cl.
CPC ...
G06F 8/36 (2013.01);
Abstract

A method for capturing patterns and associated points of variability includes providing an XML schema defining elements representing different point of variability (POV) types for a pattern. The elements belong to an XML schema 'substitution group' to enable the POV types to be substituted for one another. In selected embodiments, the method enables a pattern author to add new or custom POV types to the 'substitution group,' thereby allowing the pattern author to extend the pattern meta model to include new POV types. Once the desired POV types are defined, the method enables the pattern author to generate an instance of the XML schema, defining the points of variability for a specific pattern, using the elements defined in the XML schema “substitution group.” A corresponding apparatus and computer program product are also disclosed and claimed herein.


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