The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 26, 2016

Filed:

Nov. 26, 2013
Applicants:

The University of Chicago, Chicago, IL (US);

Minotech Engineering, Inc., Andover, MA (US);

Inventors:

Henry Frisch, Chicago, IL (US);

Herve Grabas, Louvecienne, FR;

Fukun Tang, Chicago, IL (US);

Eric J. Oberla, Chicago, IL (US);

Michael Minot, Andover, MA (US);

Assignee:

The University of Chicago, Chicago, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T 1/29 (2006.01); G01T 1/208 (2006.01); G01T 1/36 (2006.01);
U.S. Cl.
CPC ...
G01T 1/2928 (2013.01); G01T 1/208 (2013.01); G01T 1/2985 (2013.01); G01T 1/363 (2013.01);
Abstract

Large-area, flat-panel photo-detectors with sub-nanosecond time resolution based on microchannel plates are provided. The large-area, flat-panel photo-detectors enable the economic construction of sampling calorimeters with, for example, enhanced capability to measure local energy deposition, depth-of-interaction, time-of-flight, and/or directionality of showers. In certain embodiments, sub-nanosecond timing resolution supplies correlated position and time measurements over large areas. The use of thin flat-panel viewing radiators on both sides of a radiation-creating medium allows simultaneous measurement of Cherenkov and scintillation radiation in each layer of the calorimeter. The detectors may be used in a variety of applications including, for example, medical imaging, security, and particle and nuclear physics.


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