The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 2016
Filed:
Jul. 02, 2012
Kyung Jin Min, Campbell, CA (US);
Giorgi Muchaidze, Sunnyvale, CA (US);
Besarion Chikhradze, Tbilisi, GA (US);
Kyung Jin Min, Campbell, CA (US);
Giorgi Muchaidze, Sunnyvale, CA (US);
Besarion Chikhradze, Tbilisi, GA (US);
Amber Precision Instruments, Inc., San Jose, CA (US);
Abstract
A system and method for measuring near field information of a device under test (DUT) uses a reference probe and a measurement probe that are configured to sense a field. A probe calibration factor is used to determine corresponding field values for signals from the measurement probe at sampling locations about the DUT. The probe calibration factor is derived from measured signals about a conductive trace using a probe and simulated field information for the conductive trace when subjected to a simulated reference signal.