The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 2016
Filed:
Sep. 27, 2012
Siemens Aktiengesellschaft, Munich, DE;
Jan Ole Blumhagen, Erlangen, DE;
Matthias Fenchel, Erlangen, DE;
Ralf Ladebeck, Erlangen, DE;
Harald H. Quick, Erlangen, DE;
SIEMENS AKTIENGESELLSCHAFT, Munich, DE;
Abstract
A method is disclosed for acquiring magnetic resonance (MR) data for a plurality of layers of an object to be examined in a section of a magnetic resonance system having a basic magnetic field, wherein the section is located at the edge of a Field of View of the magnetic resonance system in the first direction. The method includes producing a first gradient field having a non-linearity of its location dependence in such a way that in the section the non-linearity compensates a local inhomogeneity of the basic magnetic field, and then multiple positioning of the object to be examined in a first direction, so the plurality of layers of the object to be examined perpendicular to the first direction successively includes the section. Finally, it includes the acquisition of magnetic resonance data for each of the layers with recording sequences.