The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 2016
Filed:
Dec. 10, 2012
Applicant:
Marvell International Ltd., Hamilton, BM;
Inventors:
Albert Wu, Palo Alto, CA (US);
Bruce Wang, Cupertino, CA (US);
Abdul Elaydi, Santa Clara, CA (US);
Chiping Ai, Santa Clara, CA (US);
Hungchi Chen, San Jose, CA (US);
Assignee:
Marvell International Ltd., Hamilton, BM;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01); G01R 31/20 (2006.01); G01R 31/26 (2014.01); G06F 15/00 (2006.01); H01L 23/544 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2601 (2013.01); G06F 15/00 (2013.01); H01L 23/544 (2013.01);
Abstract
Some of the embodiments of the present disclosure provide an integrated circuit (IC) chip comprising a die, a system on chip (SOC) coupled to the die, and an internal test engine included in the SOC and configured to test the die, wherein one or more components within the IC chip may be configured to be tested by an external test engine coupled to the IC chip. Other embodiments are also described and claimed.