The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 2016
Filed:
Mar. 27, 2013
Applicant:
Sysmex Corporation, Kobe-shi, Hyogo, JP;
Inventors:
Assignee:
SYSMEX CORPORATION, Hyogo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01N 35/00 (2006.01); G01N 33/00 (2006.01);
U.S. Cl.
CPC ...
G01N 35/00712 (2013.01); G01N 35/00603 (2013.01);
Abstract
A sample analyzing system comprising: a first sample analyzer including a first measurement unit for measuring a sample and a first control unit for controlling the first measurement unit; and a second sample analyzer including a second measurement unit for measuring the sample and a second control unit for controlling the second measurement unit; wherein the first control unit is configured to transmit an activation signal for activating the second sample analyzer when a predetermined condition is met for the first sample analyzer; and the second control unit is configured to activate the second sample analyzer when the activation signal is received.