The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 2016
Filed:
Feb. 16, 2012
Applicants:
Marc Leconte, Loire sur Rhone, FR;
Guillaume Bathelet, Marcy l'Etoile, FR;
Inventors:
Marc Leconte, Loire sur Rhone, FR;
Guillaume Bathelet, Marcy l'Etoile, FR;
Assignee:
MSC & SGCC, Vourles, FR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/06 (2006.01); G01N 21/90 (2006.01); G01N 21/958 (2006.01);
U.S. Cl.
CPC ...
G01N 21/958 (2013.01); G01B 11/06 (2013.01); G01B 11/0691 (2013.01); G01N 21/90 (2013.01);
Abstract
An inspection process for detecting defects of thin type, on transparent containers for a series of inspection points distributed over an inspection region superposed according to a determined height of the container taken according to central axis thereof, and according to the circumference of the container comprising: