The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 2016
Filed:
Feb. 12, 2015
Applicant:
Yokogawa Electric Corporation, Tokyo, JP;
Inventors:
Junichi Matsuo, Tokyo, JP;
Alan I. Cowie, Friendswood, TX (US);
Assignee:
YOKOGAWA ELECTRIC CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01N 21/27 (2006.01); G01N 21/39 (2006.01); G01N 21/31 (2006.01);
U.S. Cl.
CPC ...
G01N 21/274 (2013.01); G01N 21/3103 (2013.01); G01N 21/39 (2013.01); G01N 2201/02 (2013.01); G01N 2201/0612 (2013.01);
Abstract
An alignment unit for a laser analyzer that performs measurements on a substance inside a chamber includes a first alignment flange that attaches to the chamber, a second alignment flange that attaches one of a launch unit or detect unit of the laser analyzer to the chamber, an alignment stud for adjusting horizontal and vertical alignment of the second alignment flange, an optical window that keeps the chamber closed when the one of the launch unit or detect unit is removed from the chamber, and a sealing member provided between the second alignment flange and the optical window.