The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 2016
Filed:
Mar. 28, 2014
Shenzhen China Star Optoelectronics Technology Co., Ltd., Shenzhen, Guangdong, CN;
Xueli Ao, Shenzhen, CN;
Weiwei Zhang, Shenzhen, CN;
Jingming Wu, Shenzhen, CN;
Rui Xu, Shenzhen, CN;
Li Wang, Shenzhen, CN;
Xiaobo He, Shenzhen, CN;
Honghui Zhu, Shenzhen, CN;
SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD., Shenzhen, CN;
Abstract
The present application relates to a colorimeter measurement method and a colorimeter for implementing the method. The method includes the following steps: placing a measured sample on a sample platform; shooting a current image of the sample; determining an intersection angle θ between the sample and a moving direction of the sample platform; adjusting a position of a scanning light spot of a colorimeter according to the angle θ, so that the sample coincides with the moving direction of the sample platform; using the colorimeter to scan the measured sample. By implementing the colorimeter measurement method and the colorimeter of the present application, the sample can be placed optionally when it is measured. Specially, when a design value of a measured sample is approximately equal to a size of the measuring light spot, much time can be saved and manpower waste is avoided.