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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9243993 B1

PDFFull Text
Date of Patent:
Jan. 26, 2016

Filed:

Mar. 14, 2006

Sample analyzer and sample analyzing method

Applicants:

Takaaki Nagai, Kobe, JP;

Masaharu Shibata, Kobe, JP;

Noriyoshi Yoshida, Kobe, JP;

Shoichiro Asada, Akashi, JP;

Inventors:

Takaaki Nagai, Kobe, JP;

Masaharu Shibata, Kobe, JP;

Noriyoshi Yoshida, Kobe, JP;

Shoichiro Asada, Akashi, JP;

Assignee:

SYSMEX CORPORATION, Hyogo, JP;

Attorney:

Sughrue Mion, PLLC

Primary Examiner:

Rebecca M Fritchman

Int. Cl.
CPC ...
G01N 33/00 (2006.01); G01N 15/14 (2006.01); G01N 33/50 (2006.01); G01N 15/00 (2006.01); G01N 35/00 (2006.01); G01N 35/10 (2006.01);
U.S. Cl.
CPC ...
G01N 15/14 (2013.01); G01N 15/147 (2013.01); G01N 2015/008 (2013.01); G01N 2015/0069 (2013.01); G01N 2015/0073 (2013.01); G01N 2015/0084 (2013.01); G01N 2015/1486 (2013.01); G01N 2035/0094 (2013.01); G01N 2035/1032 (2013.01);
Abstract

A sample analyzer capable of operating in a first measuring mode for measuring a sample and a second measuring mode for measuring a sample, comprising: a sample provider for providing a sample; a common reagent provider for providing a common reagent used in the first measuring mode and the second measuring mode; a special reagent provider for providing a special reagent used in the second measuring mode; a mode selector for selecting one of the first measuring mode and the second measuring mode; a measuring section for measuring the sample; and wherein in the first measuring mode, the sample provider and the common reagent provider operate so as to make a first mode sample comprising the sample and the common reagent, and the measuring section operates so as to measure the first mode sample, and in the second measuring mode, the sample provider, the common reagent provider and the special reagent provider operate so as to make a second mode sample comprising the sample, the common reagent and the special reagent, and the measuring section operates so as to measure the second mode sample, is disclosed. A sample analyzing method is also disclosed.

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