The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 26, 2016

Filed:

Jun. 08, 2012
Applicant:

Fabien Quere, Vélizy Villacoublay, FR;

Inventor:

Fabien Quere, Vélizy Villacoublay, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); G01J 3/45 (2006.01); G01J 11/00 (2006.01); G01J 9/02 (2006.01);
U.S. Cl.
CPC ...
G01J 3/45 (2013.01); G01J 9/02 (2013.01); G01J 11/00 (2013.01); G01J 2009/0238 (2013.01);
Abstract

Method of characterizing a light beam having the steps of: a) disposing the input ends of N >3 optical fibers on the path of the light beam, in such a way that a respective portion of the beam is coupled and propagates in each optical fiber and is emitted from its output end so as to form a respective secondary beam; b) introducing an angular spectral dispersion into the secondary beams by means of at least one dispersive element; c) propagating the dispersed secondary beams in such a way that they overlap to form an interferogram; d) acquiring an image of the interferogram; and e) extracting from the image of the interferogram an item of information relating to the spatial variation of the phase of the light beam at a plurality of wavelengths. Device for the implementation of such a method.


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