The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 26, 2016

Filed:

Oct. 10, 2013
Applicant:

Kabushiki Kaisha Topcon, Itabashi-ku, Tokyo-to, JP;

Inventors:

Kaoru Kumagai, Tokyo-to, JP;

Takahiro Inoue, Tokyo-to, JP;

Ken-ichiro Yoshino, Tokyo-to, JP;

Assignee:

Kabushiki Kaisha TOPCON, Tokyo-to, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/14 (2006.01); G01C 1/04 (2006.01); G01C 15/00 (2006.01);
U.S. Cl.
CPC ...
G01B 11/14 (2013.01); G01C 1/04 (2013.01); G01C 15/002 (2013.01);
Abstract

A three-dimensional measuring device includes a light source unit, a light projecting optical unit, a light receiving optical unit, a light receiving element, a scanning unit, an angle detector, an illumination light source unit, an image pickup unit and a control arithmetic unit. The control arithmetic unit comprises a distance data processing unit for controlling the scanning unit, for calculating a distance to the object to be measured based on a received light signal, and for calculating a three-dimensional data of the object based on a calculated distance and a detection signal from the angle detector, and an image data processing unit for acquiring an illuminated image and an unilluminated image, for acquiring a difference image based on both images, for detecting a retroreflective target based on the difference image and a detected intensity of a reflected light from the difference image, and for calculating a position of the target.


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