The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 26, 2016

Filed:

Sep. 15, 2010
Applicants:

Roy D. Allen, North Andover, MA (US);

Mark A. Ritter, Sharon, MA (US);

Inventors:

Roy D. Allen, North Andover, MA (US);

Mark A. Ritter, Sharon, MA (US);

Assignee:

ILLINOIS TOOL WORKS INC., Glenview, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/14 (2006.01); G01D 5/347 (2006.01); G01D 5/38 (2006.01);
U.S. Cl.
CPC ...
G01B 11/14 (2013.01); G01D 5/34746 (2013.01); G01D 5/38 (2013.01);
Abstract

The disclosure relates to a remote displacement sensor, such as an optical strain gauge, which uses an optical amplifier implemented by patterns, such as, moiré patterns, to calculate changes in position. In a strain gauge with moiré patterns, two foil layers are provided, a lower foil layer with a reference or static moiré pattern generated by the overlaying of a first pattern with parallel lines at a first fundamental frequency and a second pattern with parallel lines at a second fundamental frequency. The lower foil layer further includes a first section with a first pattern with parallel lines at the first fundamental frequency while the upper layer provides a second section with a second pattern with parallel lines at the second fundamental frequency. The overlaying of the foils causes an overlying of the first and second sections thereby causing a moiré pattern of the same wavelength as the reference pattern.


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