The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 2016
Filed:
Mar. 15, 2012
Applicants:
Jan Kristian Vasshus, Sandnes, NO;
Arne Malmin, Kleppe, NO;
Inventors:
Jan Kristian Vasshus, Sandnes, NO;
Arne Malmin, Kleppe, NO;
Assignee:
Cubility AS, Sandnes, NO;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01); B07B 1/00 (2006.01); B01D 33/04 (2006.01); B01D 35/143 (2006.01); B65G 17/08 (2006.01); B65G 43/02 (2006.01); B07B 1/10 (2006.01); B07B 1/46 (2006.01); E21B 21/06 (2006.01); G08C 17/02 (2006.01);
U.S. Cl.
CPC ...
B07B 1/00 (2013.01); B01D 33/04 (2013.01); B01D 35/1435 (2013.01); B07B 1/10 (2013.01); B07B 1/4627 (2013.01); B65G 17/083 (2013.01); B65G 43/02 (2013.01); E21B 21/065 (2013.01); G08C 17/02 (2013.01);
Abstract
A method and an apparatus for monitoring the integrity of an endless sieve device () which is arranged to rotate around at least two spaced-apart turning rollers are described, the sieve device () being arranged to separate fluid and particles under a predetermined size from particles over the predetermined size, the method including the steps of:
Vasshus, Jan. (2016). Method for monitoring the integrity of a sieve device and apparatus for practice of the method (U.S. Patent No. 9242276). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9242276
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile