The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 2016
Filed:
May. 09, 2012
Xiaofeng Niu, Mundelein, IL (US);
Wenli Wang, Briarcliff Manor, NY (US);
Xiaofeng Niu, Mundelein, IL (US);
Wenli Wang, Briarcliff Manor, NY (US);
Kabushiki Kaisha Toshiba, Tokyo, JP;
Toshiba Medical Systems Corporation, Otawara-shi, JP;
Abstract
A method of estimating random events in positron emission tomography list mode data, including obtaining time-of-flight (TOF) list mode count data that includes TOF information; converting the obtained TOF list mode count data into four-dimensional (4D) raw sinogram count data, without using the TOF information, wherein the 4D raw sinogram count data includes random count values; interpolating the 4D raw sinogram count data to generate 4D interpolated sinogram count data; low-pass filtering the 4D interpolated sinogram count data to remove noise; converting the low-pass filtered 4D interpolated sinogram count data into filtered 4D raw sinogram count data; and generating, by a processor, five-dimensional (5D) TOF raw sinogram count data from the filtered 4D raw sinogram count data by effectively applying a TOF mask filter to the filtered 4D raw sinogram count data.