The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 2016
Filed:
Apr. 29, 2014
Oculus Optikgeraete Gmbh, Wetzlar, DE;
Andreas Steinmueller, Wettenberg, DE;
OCULUS OPTIKGERAETE GMBH, Wetzlar, DE;
Abstract
An ophthalmological analysis system for examining an eye, in particular in the region of a front eye section of an eye includes first and second analysis systems obtaining sectional images of the eye. The first analysis system includes a projection device and a monitoring device arranged relative to each other according to the Scheimpflug rule. The second analysis system is an optical coherence interferometer. A processing device processes a first image data set obtained by the first analysis system and a second image data set obtained by the second analysis system to supplement the first image data set, at least partially, with data of the second image data set.