The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 26, 2016

Filed:

Feb. 14, 2011
Applicants:

Richard L. Ornberg, Burleson, TX (US);

Gary W. Williams, Burleson, TX (US);

Inventors:

Richard L. Ornberg, Burleson, TX (US);

Gary W. Williams, Burleson, TX (US);

Assignee:

Alcon Research, Ltd., Fort Worth, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/10 (2006.01); G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
A61B 3/10 (2013.01); G06T 7/0012 (2013.01); G06T 2207/10012 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/10064 (2013.01); G06T 2207/20056 (2013.01); G06T 2207/30041 (2013.01);
Abstract

The invention provides methods for detecting ocular surface defects. The methods of the invention can be used to detect ocular surface diseases, such as dry eye, uveitis, conjunctivitis, keratitis, keratoconjunctivitis, vernal keratoconjunctivitis (VKC), atopic keratoconjunctivitis (AKC), autoimmune disorders of the ocular surface, meibomianitis, conjunctival hyperemia, eyelid hyperemia, ocular rosacea, ocular inflammation, or eye lid swelling.


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