The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 19, 2016

Filed:

Jul. 31, 2013
Applicant:

Oracle International Corporation, Redwood Shores, CA (US);

Inventors:

Sam Eric McMurry, Richardson, TX (US);

Ben Allen Campbell, Irving, TX (US);

Robert James Sparks, Plano, TX (US);

Assignee:

ORACLE INTERNATIONAL CORPORATION, Redwood Shores, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 12/801 (2013.01); H04L 12/703 (2013.01);
U.S. Cl.
CPC ...
H04L 47/127 (2013.01); H04L 45/28 (2013.01);
Abstract

Methods, systems, and computer readable media for predicting imminent Diameter overload conditions using load information are disclosed. One embodiment of a system for implementing the subject matter described herein includes a first Diameter node including at least one network interface for receiving Diameter messages and a Diameter overload prediction unit. The Diameter overload prediction unit may be configured to extract load information from the Diameter messages, detect a traffic pattern using the extracted load information, predict at least one overload condition associated with one or more other Diameter nodes, and communicate an indication of the predicted overload condition to at least some of the other Diameter nodes before a time at which the overload condition is predicted to occur.


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