The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 19, 2016
Filed:
Feb. 28, 2014
Texas Instruments Incorporated, Dallas, TX (US);
TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US);
Abstract
A method for testing linearity of an ADC, comprising receiving a trigger signal indicating an ADC input voltage step adjustment, reading an ADC output sample upon receiving the trigger signal, wherein the ADC output sample has a value range of N integer values that correspond to N discrete ADC output codes, computing a histogram of code occurrences for M consecutive ADC output codes, wherein the histogram comprises M number of bins corresponding to the M consecutive ADC output codes, and wherein M is less than N, updating a DNL value and an INL value according to the histogram at an interval of K number of ADC output sample readings, and shifting the histogram by one ADC output code after updating the DNL and the INL values.