The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 19, 2016

Filed:

Jan. 16, 2015
Applicant:

Kabushiki Kaisha Toshiba, Tokyo, JP;

Inventors:

Toshiaki Nakasu, Tokyo, JP;

Hidetaka Ohira, Tokyo, JP;

Tsukasa Ike, Tokyo, JP;

Ryuzo Okada, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2006.01); G06F 3/01 (2006.01); G06F 3/0485 (2013.01); G06F 3/0484 (2013.01); G06T 7/20 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0042 (2013.01); G06F 3/017 (2013.01); G06F 3/0485 (2013.01); G06F 3/04842 (2013.01); G06T 7/2033 (2013.01);
Abstract

In an embodiment, a recognition apparatus includes: an obtaining unit configured to obtain positions of a specific part in a coordinate system having a first axis to an n-th axis (n≧2); a calculating unit configured to calculate a movement vector of the specific part; a principal axis selecting unit configured to select a principal axis; a turning point setting unit configured to set a position at which there is a change in the principal axis, and set a position at which there is a change; a section setting unit configured to set a determination target section, and set a previous section; a determining unit configured to calculate an evaluation value of the determination target section and an evaluation value of the immediately previous section and, determine which of the first axis to the n-th axis is advantageous; and a presenting unit configured to perform the determined result.


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