The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 19, 2016
Filed:
Mar. 29, 2012
Gregory A. Harrison, Oviedo, FL (US);
Sreerupa Das, Oviedo, FL (US);
Michael A. Bodkin, Orlando, FL (US);
Richard M. Hall, Orlando, FL (US);
Eric W. Worden, Orlando, FL (US);
Stefan Herzog, Jr., Casselberry, FL (US);
Gregory A. Harrison, Oviedo, FL (US);
Sreerupa Das, Oviedo, FL (US);
Michael A. Bodkin, Orlando, FL (US);
Richard M. Hall, Orlando, FL (US);
Eric W. Worden, Orlando, FL (US);
Stefan Herzog, Jr., Casselberry, FL (US);
Lockheed Martin Corporation, Bethesda, MD (US);
Abstract
Quantification of a condition of a selected item using a neural network is disclosed. A device defines a good hypertube in a neural state space based on good item state points obtained from one or more items that exhibit desired operating characteristics, and a bad hypertube in the neural state space based on bad item state points obtained from one or more items that exhibit undesirable operating characteristics. A current item state hyperpoint is determined in the neural state space based on a current item state point of the selected item. A condition of the selected item is quantified as a function of a location of the current item state hyperpoint with respect to at least a portion of the good hypertube and with respect to at least a portion of the bad hypertube.