The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 19, 2016

Filed:

Feb. 07, 2013
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Yuki Yonetani, Utsunomiya, JP;

Yasunori Furukawa, Utsunomiya, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01); G06K 9/50 (2006.01); G01B 11/255 (2006.01); G01M 11/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/50 (2013.01); G01B 11/255 (2013.01); G01M 11/005 (2013.01); G06K 9/46 (2013.01);
Abstract

A surface shape measurement method that divides a surface shape of an object () into a plurality of partial regions () to obtain partial region data and that stitches the partial region data to measure the surface shape of the object, and the method includes the steps of calculating sensitivity of an error generated by a relative movement between the object and a sensor () for each of the partial regions, dividing the surface shape of the object into the plurality of partial regions to obtain the partial region data, obtaining the partial region data, calculating an amount corresponding to the error using the sensitivity, correcting the partial region data using the amount corresponding to the error, and stitching the corrected partial region data to calculate the surface shape of the object.


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