The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 19, 2016

Filed:

Jun. 20, 2013
Applicant:

Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;

Inventor:

Narishige Abe, Kawasaki, JP;

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/03 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00087 (2013.01); G06K 9/0008 (2013.01); G06K 9/00026 (2013.01); G06K 9/036 (2013.01);
Abstract

The quality of biometric information that will be input the next time is estimated. Estimated matching quality information is calculated which indicates the degree of matching between estimated quality information and quality information of the actually input biometric information. Further, past quality information is calculated which indicates how the quality of a plurality of pieces of estimated matching quality information varied in the past. Then, whether or not the biometric information is to be registered is determined according to the estimated matching quality information and the past quality information.


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