The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 19, 2016

Filed:

Jun. 09, 2014
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Daniel J. Post, Campbell, CA (US);

Nir J. Wakrat, Los Altos, CA (US);

Assignee:

APPLE INC., Cupertino, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 12/02 (2006.01); G06F 3/06 (2006.01); G11C 16/34 (2006.01); G06F 7/58 (2006.01);
U.S. Cl.
CPC ...
G06F 12/0246 (2013.01); G06F 3/064 (2013.01); G06F 3/0616 (2013.01); G06F 3/0679 (2013.01); G11C 16/349 (2013.01); G06F 7/588 (2013.01); G06F 2212/7211 (2013.01);
Abstract

Systems and methods are disclosed for stochastic block allocation for improved wear leveling for a system having non-volatile memory ('NVM'). The system can probabilistically allocate a block or super block for wear leveling based on statistics associated with the block or super block. In some embodiments, the system can select a set of blocks or super blocks based on a pre-determined threshold of a number of cycles (e.g., erase cycles and/or write cycles). The block or super block can then be selected from the set of super blocks. In other embodiments, the system can use a fully stochastic approach by selecting a block or super block based on a biased random variable. The biased random variable may be generated based in part on the number of cycles associated with each block or super block of the NVM.


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