The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 19, 2016
Filed:
Sep. 27, 2012
Applicants:
Steven R. J. Brueck, Albuquerque, NM (US);
Alexander Neumann, Albuquerque, NM (US);
Yuliya Kuznetsova, Albuquerque, NM (US);
Inventors:
Steven R. J. Brueck, Albuquerque, NM (US);
Alexander Neumann, Albuquerque, NM (US);
Yuliya Kuznetsova, Albuquerque, NM (US);
Assignee:
STC.UNM, Albuquerque, NM (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01); G02B 21/00 (2006.01); G02B 21/36 (2006.01); G06T 3/40 (2006.01); G01N 21/65 (2006.01);
U.S. Cl.
CPC ...
G02B 21/06 (2013.01); G02B 21/0056 (2013.01); G02B 21/365 (2013.01); G06T 3/4061 (2013.01); G01N 2021/653 (2013.01);
Abstract
In accordance with the aspects of the present disclosure, a method and apparatus is disclosed for imaging interferometric microscopy (IIM), which can use an immersion medium to enhance resolution up to a resolution of linear systems resolution limit of λ/4n, where λ is the wavelength in free space and n is the index of refraction of a transmission medium.