The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 19, 2016

Filed:

Aug. 29, 2011
Applicants:

Michael S. Bittar, Houston, TX (US);

Roland Edward Chemali, Humble, TX (US);

Inventors:

Michael S. Bittar, Houston, TX (US);

Roland Edward Chemali, Humble, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/38 (2006.01); G01V 3/00 (2006.01); G01V 3/30 (2006.01); G01V 11/00 (2006.01); G01V 3/28 (2006.01);
U.S. Cl.
CPC ...
G01V 3/30 (2013.01); G01V 11/002 (2013.01); G01V 3/28 (2013.01);
Abstract

In various embodiments, apparatus and methods are provided to determine formation resistivity associated with a well. Measurements taken using sub-arrays of a tool at different distances of investigation can be used to determine formation resistivity, where the sub-arrays are arranged to make azimuthal related measurements. Separations readings related to resistivity can be generated from signals received from different directions and can be analyzed to characterize validity of a measurement reading. Additional apparatus, systems, and methods are disclosed.


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