The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 19, 2016

Filed:

Jan. 28, 2014
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Rajesh Kumar Mittal, Bangalore, IN;

Charles Kurian, Bangalore, IN;

Sumanth Reddy Poddutur, Bangalore, IN;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/3185 (2006.01);
U.S. Cl.
CPC ...
G01R 31/318552 (2013.01); G01R 31/318536 (2013.01); G01R 31/31858 (2013.01); G01R 31/318541 (2013.01); G01R 31/318555 (2013.01); G01R 31/318563 (2013.01);
Abstract

A circuit that facilitates faster diagnosis of plurality of logic circuits connected in a scan chain is provided. The circuit includes a first multiplexer that receives a scan data input. A flip-flop is coupled to an output of the first multiplexer and generates a scan pattern. An inverter generates an inverted feedback signal in response to the scan pattern. The inverted feedback signal is provided to the first multiplexer. A plurality of logic circuits is connected in a scan chain and generates a logic output in response to the scan pattern. A bypass multiplexer is coupled to the plurality of logic circuits. The bypass multiplexer generates a scan output in response to the logic output, the scan data input and a segment bypass input.


Find Patent Forward Citations

Mittal, Rajesh. (2016). Dft approach to enable faster scan chain diagnosis (U.S. Patent No. 9239360). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9239360

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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