The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 19, 2016

Filed:

May. 28, 2013
Applicant:

Wistron Corporation, New Taipei, TW;

Inventors:

I-Ming Chen, New Taipei, TW;

Chun-Kuan Liu, New Taipei, TW;

Kun-Liang Lai, New Taipei, TW;

Assignee:

Wistron Corporation, New Taipei, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); H04M 3/30 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2825 (2013.01); H04M 3/308 (2013.01);
Abstract

The test board serves as an interface for testing a conference phone. The test board includes a plurality of test channel selectors. Each of the test channel selectors receives a plurality of test voltages provided by the conference phone and a first and a second control signals. The test voltages are divided into a plurality test voltage pairs, and each of the test channel selectors selects one of the test voltages in each of the test voltage pairs for generating a plurality of selected voltages according to the first control signal. Each of the test channel selectors selects two of the selected voltages for generating a first and a second output voltages according to the second control signal, where the first and the second output voltages are transmitted to a test machine for testing the conference phone.


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