The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 19, 2016
Filed:
Sep. 18, 2009
Simon Higgins, Johannesburg, ZA;
Simon Higgins, Johannesburg, ZA;
Eskom Holdings SOC Limited, Johannesburg, ZA;
Abstract
This invention relates to a method of, and a system for, monitoring electromagnetic interference. The method comprising capturing a plurality of time domain waveforms, and a plurality of scatter plots; receiving the plurality of captured time domain waveforms and scatter plots; applying a fast fourier transform (FFT) to each of the received time domain waveforms as it is received thereby to receive FFT outputs; storing the FFT outputs in a database; generating a statistically representative spectrograph or spectrogram in the frequency domain based on at least the stored FFT outputs and scatter plots or data associated with the scatter plots, combining constituent FFTs of the statistically representative spectrograph or spectrogram in such a manner as to emulate the result that would be produced by an EMI (Electromagnetic Interference) receiver or spectrum analyzer; and combining resultant outputs from a number of iterations of this process to produce a final result (EMI spectrum).