The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 19, 2016
Filed:
Sep. 09, 2014
Shimadzu Corporation, Kyoto-shi, Kyoto, JP;
Honda Motor Co., Ltd., Tokyo, JP;
Tetsuya Nagai, Nishinomiya, JP;
Nobuyuki Iwai, Kyoto, JP;
Yasuyuki Furukawa, Kyoto, JP;
Ryoji Hiraoka, Hirakata, JP;
Isao Azumagakito, Wako, JP;
Satoru Okada, Wako, JP;
SHIMADZU CORPORATION, Kyoto-shi, JP;
HONDA MOTOR CO., LTD., Tokyo, JP;
Abstract
There are provided an optical measurement probe capable of obtaining a more stable measurement result, and an optical measurement device provided with the same. An incidence surface of an optical window to be used in a high temperature environment is covered by a deposited film. The optical window is formed of sapphire, and the deposited film is formed from SiO. Adhesion of dirt to the incidence surface, and an influence, on a measurement result, of the adhesion of dirt on the incidence surface can thereby be prevented, and a more stable measurement result can be obtained.