The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 19, 2016
Filed:
Apr. 05, 2014
Optikos Corporation, Wakefield, MA (US);
Daniel Orband, Boxford, MA (US);
OPTIKOS CORPORATION, Wakefield, MA (US);
Abstract
A system for quickly aligning a test optic with various components of an optical metrology tool. A collimated target is presented to a beamsplitting reference surface located on a positioning system for holding and manipulating the test optic. Video images of the target and its reflection from the reference surface are displayed for analysis and visualization so that any tilt between the reference surface and the optical axis of the collimated beam can be removed to align the test optic. After alignment, the video based system is used to quickly measure and display in real-time a variety of performance characteristics of optical components such as lenses. The metrology system is under the control of a computer which uses a windowing software program to provide the user with a graphical user interface by which the various components of the system and test lenses may be aligned and characterized.