The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 19, 2016

Filed:

Jan. 23, 2014
Applicant:

The Governors of the University of Alberta, Edmonton, CA;

Inventors:

Robert Fedosejevs, Edmonton, CA;

Ilya Utkin, Edmonton, CA;

Sunita Sindhu, Edmonton, CA;

Ying Yin Tsui, Edmonton, CA;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); G01B 11/06 (2006.01); G01N 21/45 (2006.01);
U.S. Cl.
CPC ...
G01B 9/0209 (2013.01); G01B 11/0625 (2013.01); G01B 11/0675 (2013.01); G01N 21/45 (2013.01);
Abstract

An apparatus for measuring the quantity and optical parameters of a liquid in a container using the principle of optical low coherence reflectometry is provided, the apparatus having: a source arm with a low coherence light source; a reference arm including a reference lens, a mirror, means for adjusting the distance between the reference lens and the mirror and means for measuring the distance between the reference lens and the mirror; a test arm with a test lens; means for dividing the output of the source arm between the test arm and the reference arm; means for combining light reflected back into the reference arm and the test arm to create an interference signal; and means for detecting and analyzing the interference signal.


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