The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 19, 2016
Filed:
Mar. 26, 2014
Honeywell International Inc., Morristown, NJ (US);
Antti Paavola, Tampere, FI;
Markku Kellomaki, Pohjois-Savo, FI;
Honeywell International Inc., Morris Plains, NJ (US);
Abstract
A method includes obtaining measurements associated with one or more controlled variables related to a structure of creped tissue paper during production of the creped tissue paper. The method also includes generating at least one control signal that adjusts one or more manipulated variables associated with the production of the creped tissue paper in order to alter the structure of the creped tissue paper. The one or more controlled variables include a number of folds per unit length of the creped tissue paper, a caliper of the creped tissue paper, a macro crepe of the creped tissue paper, and/or a micro crepe of the creped tissue paper. The manipulated variable(s) could include a crepe percentage, a creping blade angle, a flow of sizing agent, and/or a cross direction (CD) profile of nozzle positions associated with a spray boom that sprays sizing agent onto a Yankee dryer.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile