The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 19, 2016

Filed:

Jan. 08, 2013
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Yasuyuki Numajiri, Kawasaki, JP;

Tomoyuki Makihira, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/14 (2006.01); A61B 3/113 (2006.01); A61B 3/117 (2006.01); A61B 3/12 (2006.01); A61B 3/10 (2006.01);
U.S. Cl.
CPC ...
A61B 3/113 (2013.01); A61B 3/1025 (2013.01); A61B 3/117 (2013.01); A61B 3/12 (2013.01);
Abstract

Provided is an ophthalmologic image pickup apparatus for measuring movement of an eye to be inspected at higher speed than a conventional one. The ophthalmologic image pickup apparatus for acquiring an image of an eye to be inspected based on return light from the eye to be inspected which is irradiated with measuring light via a scanning unit, includes: a position acquiring unit for acquiring a plurality of positions of characteristic portions in the image of the eye to be inspected based on the return light from the eye to be inspected corresponding respectively to a plurality of scanning lines of the scanning unit in the image of the eye to be inspected; and a measuring unit for measuring movement of the eye to be inspected based on the plurality of positions.


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