The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 12, 2016
Filed:
Feb. 28, 2013
Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;
Kaushik Morapakkam Josiam, Dallas, TX (US);
Ankit Gupta, Redmond, WA (US);
Shadi Abu-Surra, Plano, TX (US);
Zhouyue Pi, Allen, TX (US);
Ying Li, Richardson, TX (US);
Sridhar Rajagopal, Plano, TX (US);
SAMSUNG ELECTRONICS CO., LTD., Suwon-Si, KR;
Abstract
A method and apparatus report or identify channel quality information. The method for reporting includes selecting one or more beams for channel quality reporting. The method also includes mapping, by the UE, indices of the one or more selected beams to one or more channel quality values. Additionally, the method includes sending channel quality information for the one or more selected beams according to the mapping. The method for identifying includes receiving an indication of indices of one or more beams selected for reporting. The method also includes receiving channel quality information for the one or more selected beams. The method further includes identifying a mapping of the indices of the one or more selected beams to one or more channel quality values. Additionally, the method includes identifying a channel quality value for each of the one or more selected beams according to the mapping.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile