The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 12, 2016

Filed:

Sep. 18, 2012
Applicant:

Flir Systems, Inc., Wilsonville, CA (US);

Inventors:

Nicholas Högasten, Santa Barbara, CA (US);

Malin Ingerhed, Linköping, SE;

Assignee:

FLIR Systems, Inc., Wilsonville, OR (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/365 (2011.01); H04N 5/33 (2006.01);
U.S. Cl.
CPC ...
H04N 5/3658 (2013.01); H04N 5/33 (2013.01);
Abstract

Various techniques are provided to process infrared images. In one implementation, a method of processing infrared image data includes receiving infrared image data associated with a scene. The infrared image data comprises a plurality of pixels arranged in a plurality of rows and columns. The method also includes selecting one of the columns. The method also includes, for each pixel of the selected column, comparing the pixel to a corresponding plurality of neighborhood pixels. The method also includes, for each comparison, adjusting a first counter if the pixel of the selected column has a value greater than the compared neighborhood pixel. The method also includes, for each comparison, adjusting a second counter if the pixel of the selected column has a value less than the compared neighborhood pixel. The method also includes selectively updating a column correction term associated with the selected column based on the first and second counters.


Find Patent Forward Citations

Loading…